DTMES 2022 - Presentation
Jose Schutt-Aine, University of Illinois
Abstract - The era of big data will lead to systems handling the transport of large amounts of information. This trend is expected to persist in the future. At the same time, in order to keep up with the data throughput needed over limited resources, high edge rates are being used for signaling. This causes various signal integrity impairments, which in turn limit the system performance and force the data rates to be well below the Shannon limit of the channel capacity. Measurements at microwave frequencies have been essential for the design of high-speed systems found in computers and communication networks. Traditionally, these measurements have been prohibitive due to the high cost associated with microwave equipment. Recent progress in portable computers and analog-to-digital computers have contributed to make such measurements more affordable. In addition, the development of scripting languages have facilitated the control of these equipment. This tutorial provides an introduction to scattering parameters for microwave measurements and how they can be measured using relatively low-cost setup. A theoretical background is provided followed by some examples and applications.
Jose Schutt-Aine received the B.S. degree in electrical engineering from the Massachusetts Institute of Technology,
Cambridge, MA, in 1981, and the M.S. and Ph.D. degrees from the University of Illinois at Urbana-Champaign (UIUC), Urbana, in 1984 and 1988, respectively.
From 1981 to 1983, he worked at the Hewlett-Packard Technology Center, Santa Rosa, CA, as an Application Engineer, where he was involved in research on microwave transistors
and high-frequency circuits. In 1988, he joined the Electrical and Computer Engineering Department as a member of the Electromagnetics and Coordinated Science Laboratories,
where he is currently involved in research on signal integrity for high-speed digital and high-frequency applications. He is a consultant for several corporations. His current
research interests include the study of signal integrity and the generation of computer-aided design tools for high-speed digital systems. Dr. Schutt-Aine was a recipient of several
research awards, including the 1991 National Science Foundation (NSF) MRI Award, the NASA Faculty Award for Research in 1992, the NSF MCAA Award in 1996, and the UIUC-NCSA Faculty
Fellow Award in 2000. He has received several publication awards including the IEEE EDAPS- 2013 Best Paper and the IEEE-EPEPS-2014 Best Paper. He is an EPS Distinguished Lecturer,
an IEEE Fellow, and served as Co-Editor-in-Chief of the IEEE Transactions on Components, Packaging and Manufacturing Technology from 2007-2018.